IEEE - Institute of Electrical and Electronics Engineers, Inc. - Aspect-Aware Points-to Analysis

2008 Eighth IEEE International Working Conference on Source Code Analysis and Manipulation (SCAM 2008)

Author(s): Qiang Sun ; Jianjun Zhao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Beijing, China
Conference Date: 28 September 2008
Page(s): 143 - 152
ISBN (Paper): 978-0-7695-3353-7
DOI: 10.1109/SCAM.2008.30
Regular:

Points-to analysis is a fundamental analysis technique whose results are useful in compiler optimization and software engineering tools. Although many points-to analysis algorithms have been... View More

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