IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis and comparison of simulation techniques for silver superlenses

2008 International Conference on Nanoscience and Nanotechnology (ICONN)

Author(s): C.P. Moore ; M.D. Arnold ; P.J. Bones ; R.J. Blaikie
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2008
Conference Location: Melbourne, Vic., Australia
Conference Date: 25 February 2008
Page(s): 210 - 213
ISBN (CD): 978-1-4244-1504-5
ISBN (Paper): 978-1-4244-1503-8
DOI: 10.1109/ICONN.2008.4639284
Regular:

Transfer-matrix and finite element modelling techniques were used to simulate single- and multi-layer silver-based superlenses. The techniques were compared for their abilities to simulate sub-... View More

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