IEEE - Institute of Electrical and Electronics Engineers, Inc. - A statistical approach for measuring dislocations in 2D photonic crystals

2008 International Conference on Nanoscience and Nanotechnology (ICONN)

Author(s): R. Malureanu ; L.H. Frandsen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2008
Conference Location: Melbourne, Vic., Australia
Conference Date: 25 February 2008
Page(s): 200 - 202
ISBN (CD): 978-1-4244-1504-5
ISBN (Paper): 978-1-4244-1503-8
DOI: 10.1109/ICONN.2008.4639281
Regular:

In this paper, a comparison between the placement accuracy of lattice atoms in photonic crystal structures fabricated with different lithographic techniques is made. Using atomic force microscopy... View More

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