IEEE - Institute of Electrical and Electronics Engineers, Inc. - Atomic force microscopy for industry with the Akiyama-Probe sensor

2008 International Conference on Nanoscience and Nanotechnology (ICONN)

Author(s): S. Stucklin ; M.R. Gullo ; T. Akiyama ; M. Scheidiger
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2008
Conference Location: Melbourne, Vic., Australia
Conference Date: 25 February 2008
Page(s): 79 - 82
ISBN (CD): 978-1-4244-1504-5
ISBN (Paper): 978-1-4244-1503-8
DOI: 10.1109/ICONN.2008.4639250
Regular:

For atomic force microscopy (AFM) to extend its usefulness into routine industry applications, its operation needs to be simplified. This paper shows how the novel Akiyama-Probe has been... View More

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