IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterisation of methane plasma treated carbon surfaces

2008 International Conference on Nanoscience and Nanotechnology (ICONN)

Author(s): A. Deslandes ; M. Jasieniak ; M. Ionescu ; J.G. Shapter ; J.S. Quinton
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2008
Conference Location: Melbourne, Vic., Australia
Conference Date: 25 February 2008
Page(s): 24 - 27
ISBN (CD): 978-1-4244-1504-5
ISBN (Paper): 978-1-4244-1503-8
DOI: 10.1109/ICONN.2008.4639236
Regular:

Time of Flight Secondary Ion Mass Spectrometry (ToF-SIMS) was used to investigate the chemical nature of methane plasma treated graphite surfaces. Principle Component Analysis (PCA) was applied to... View More

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