IEEE - Institute of Electrical and Electronics Engineers, Inc. - A higher-order mismatch-shaping method for multi-bit Sigma-Delta Modulators

2008 IEEE International SOC Conference (SOCC)

Author(s): A. Lavzin ; M. Kozak ; E.G. Friedman
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 September 2008
Conference Location: Newport Beach, CA, USA
Conference Date: 17 September 2008
Page(s): 267 - 270
ISBN (CD): 978-1-4244-2597-6
ISBN (Paper): 978-1-4244-2596-9
DOI: 10.1109/SOCC.2008.4641525
Regular:

Mismatch-shaping dynamic element matching (DEM) methods are extensively used in multi-bit sigma-delta modulators (SDM) to reduce the effects of element mismatches. To date, only first and... View More

Advertisement