IEEE - Institute of Electrical and Electronics Engineers, Inc. - Damage identification of structure and test study based on wavelet transform

2008 International Conference on Wavelet Analysis and Pattern Recognition (ICWAPR)

Author(s): Qian-Ying Ma ; She-Liang Wang ; Jun-Qiang Zhu ; Cheng-Zhong Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2008
Conference Location: Hong Kong, China
Conference Date: 30 August 2008
Volume: 2
Page(s): 569 - 573
ISBN (CD): 978-1-4244-2239-5
ISBN (Paper): 978-1-4244-2238-8
DOI: 10.1109/ICWAPR.2008.4635844
Regular:

Teeming with large-span and complex structure, it play a more and more important role in on-line monitor and diagnosis of structure health based on the advanced equipment and scientific methods.... View More

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