IEEE - Institute of Electrical and Electronics Engineers, Inc. - Multi-class AUC metrics and weighted alternatives

2008 IEEE International Joint Conference on Neural Networks (IEEE World Congress on Computational Intelligence)

Author(s): B. Van Calster ; V. Van Belle ; G. Condous ; T. Bourne ; D. Timmerman ; S. Van Huffel
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Hong Kong, China
Conference Date: 1 June 2008
Page(s): 1,390 - 1,396
ISBN (CD): 978-1-4244-1821-3
ISBN (Paper): 978-1-4244-1820-6
ISSN (Paper): 1098-7576
DOI: 10.1109/IJCNN.2008.4633979
Regular:

The area under the receiver operating characteristic curve (AUC) is a useful and widely used measure to evaluate the performance of binary and multi-class classification models. However, it does... View More

Advertisement