IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using stochastic logic for efficient pattern recognition analysis

2008 IEEE International Joint Conference on Neural Networks (IEEE World Congress on Computational Intelligence)

Author(s): J.L. Rossello ; V. Canals ; I. de Paul ; J. Segura
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Hong Kong, China
Conference Date: 1 June 2008
Page(s): 1,057 - 1,061
ISBN (CD): 978-1-4244-1821-3
ISBN (Paper): 978-1-4244-1820-6
ISSN (Paper): 1098-7576
DOI: 10.1109/IJCNN.2008.4633929
Regular:

We present a pattern recognition methodology based on stochastic logic. The technique implements a parallel comparison of input data from a set of sensors to various pre-stored categories. Smart... View More

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