IEEE - Institute of Electrical and Electronics Engineers, Inc. - Feature selection based on kernel pattern similarity

2008 IEEE International Joint Conference on Neural Networks (IEEE World Congress on Computational Intelligence)

Author(s): Yaohua Tang ; Jinghuai Gao ; Guangzhao Cui
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Hong Kong, China
Conference Date: 1 June 2008
Page(s): 947 - 954
ISBN (CD): 978-1-4244-1821-3
ISBN (Paper): 978-1-4244-1820-6
ISSN (Electronic): 2161-4407
ISSN (Paper): 2161-4393
DOI: 10.1109/IJCNN.2008.4633913
Regular:

Reduction of feature dimensionality is of considerable importance in machine learning. The generalization performance of classification system improves when correlated and redundant features are... View More

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