IEEE - Institute of Electrical and Electronics Engineers, Inc. - Detection and recognition on parameters of object’s internal structure

2008 IEEE International Joint Conference on Neural Networks (IEEE World Congress on Computational Intelligence)

Author(s): Gang Xu ; Xu Meng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Hong Kong, China
Conference Date: 1 June 2008
Page(s): 543 - 547
ISBN (CD): 978-1-4244-1821-3
ISBN (Paper): 978-1-4244-1820-6
ISSN (Paper): 1098-7576
DOI: 10.1109/IJCNN.2008.4633846
Regular:

The detection of objects, the key technology in the field of image recognition, is the base of accuracy improvement of image recognition process. In this paper, a model is provided for detection... View More

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