IEEE - Institute of Electrical and Electronics Engineers, Inc. - Ensemble classification based on correlation analysis for face recognition

2008 IEEE International Joint Conference on Neural Networks (IEEE World Congress on Computational Intelligence)

Author(s): Yang Liu ; Yanwei Zheng ; Yuehui Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Hong Kong, China
Conference Date: 1 June 2008
Page(s): 299 - 303
ISBN (CD): 978-1-4244-1821-3
ISBN (Paper): 978-1-4244-1820-6
ISSN (Paper): 1098-7576
DOI: 10.1109/IJCNN.2008.4633807
Regular:

This paper presents a new face recognition approach by using correlation analysis and ensemble classifiers based on support vector machine (SVM). In this approach, image pre-processing techniques... View More

Advertisement