IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sensitivity analysis of S-parameters Including port variations using the Transfinite Element Method

2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008

Author(s): L. Vardapetyan ; J. Manges ; Z. Cendes
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Atlanta, GA, USA, USA
Conference Date: 15 June 2008
Page(s): 527 - 530
ISBN (CD): 978-1-4244-1781-0
ISBN (Paper): 978-1-4244-1780-3
ISSN (Paper): 0149-645X
DOI: 10.1109/MWSYM.2008.4633219
Regular:

Sensitivity analysis of microwave devices with respect to design parameters is presented. Ports are included in the computational domain via the Transfinite Element Method. The derivative of the... View More

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