IEEE - Institute of Electrical and Electronics Engineers, Inc. - Vector and harmonic amplitude/phase corrected multi-envelope stimulus response measurements of nonlinear devices

2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008

Author(s): Loren Betts
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Atlanta, GA, USA, USA
Conference Date: 15 June 2008
Page(s): 261 - 264
ISBN (CD): 978-1-4244-1781-0
ISBN (Paper): 978-1-4244-1780-3
ISSN (Paper): 0149-645X
DOI: 10.1109/MWSYM.2008.4633153
Regular:

This paper describes a novel nonlinear measurement instrument based on a vector and amplitude/phase corrected network analyzer with integrated pulse multi-envelope measurement capabilities. The... View More

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