IEEE - Institute of Electrical and Electronics Engineers, Inc. - Signal integrity in reflection-limited channels

2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008

Author(s): James F. Buckwalter
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Atlanta, GA, USA, USA
Conference Date: 15 June 2008
Page(s): 1,565 - 1,568
ISBN (CD): 978-1-4244-1781-0
ISBN (Paper): 978-1-4244-1780-3
ISSN (Paper): 0149-645X
DOI: 10.1109/MWSYM.2008.4633081
Regular:

High-speed digital signal integrity is strongly limited by microwave reflections, which degrade the reliability of a serial link. This work describes the relationship between the reflections and... View More

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