IEEE - Institute of Electrical and Electronics Engineers, Inc. - An electronically scanned array with 180° scanning range using coupled phase-locked loops

2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008

Author(s): Sheng-Hong Yan ; Tah-Hsiung Chu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Atlanta, GA, USA, USA
Conference Date: 15 June 2008
Page(s): 699 - 702
ISBN (CD): 978-1-4244-1781-0
ISBN (Paper): 978-1-4244-1780-3
ISSN (Paper): 0149-645X
DOI: 10.1109/MWSYM.2008.4632928
Regular:

In this paper, we present an active electronically scanned array with a 180° beam-scanning angle. With using type-II coupled phase-locked loop array and a reference signal, the array has stable... View More

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