IEEE - Institute of Electrical and Electronics Engineers, Inc. - A New Similarity Measure Based on Weibull Distribution for Detecting Plagiarized Source Codes

2008 International Conference on Convergence and Hybrid Information Technology (ICHIT)

Author(s): Jeong-Hoon Ji ; Gyun Woo ; Hwan-Gue Cho
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2008
Conference Location: Daejeon, South Korea
Conference Date: 28 August 2008
Page(s): 56 - 59
ISBN (Paper): 978-0-7695-3328-5
DOI: 10.1109/ICHIT.2008.277
Regular:

Most of previously released plagiarism detection tools and systems have been adopted normalized similarity measures which are unreliably sensitive to the size of programs compared. Also the most... View More

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