IEEE - Institute of Electrical and Electronics Engineers, Inc. - Tempest: Towards early identification of failure-prone binaries

2008 IEEE International Conference on Dependable Systems & Networks With FTCS and DCC (DSN)

Author(s): T. Bhat ; N. Nagappan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Anchorage, AK, USA
Conference Date: 24 June 2008
Page(s): 116 - 121
ISBN (CD): 978-1-4244-2398-9
ISBN (Paper): 978-1-4244-2397-2
DOI: 10.1109/DSN.2008.4630079
Regular:

Early estimates of failure-proneness can be used to help inform decisions on testing, refactoring, design rework etc. Often such early estimates are based on code metrics like churn and... View More

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