IEEE - Institute of Electrical and Electronics Engineers, Inc. - Trace-based microarchitecture-level diagnosis of permanent hardware faults

2008 IEEE International Conference on Dependable Systems & Networks With FTCS and DCC (DSN)

Author(s): Man-Lap Li ; P. Ramachandran ; S.K. Sahoo ; S.V. Adve ; V.S. Adve ; Yuanyuan Zhou
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Anchorage, AK, USA
Conference Date: 24 June 2008
Page(s): 22 - 31
ISBN (CD): 978-1-4244-2398-9
ISBN (Paper): 978-1-4244-2397-2
DOI: 10.1109/DSN.2008.4630067
Regular:

As devices continue to scale, future shipped hardware will likely fail due to in-the-field hardware faults. As traditional redundancy-based hardware reliability solutions that tackle these faults... View More

Advertisement