IEEE - Institute of Electrical and Electronics Engineers, Inc. - Cluster Analysis on Technological Innovation Ability of Enterprises Based on SOM Network----Taking the MLEs in Henan as an Example

2008 ISECS International Colloquium on Computing, Communication, Control, and Management (CCCM)

Author(s): Fangyuan Lu ; Keyan Jiao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2008
Conference Location: Guangzhou, China
Conference Date: 3 August 2008
Volume: 3
Page(s): 230 - 234
ISBN (Paper): 978-0-7695-3290-5
DOI: 10.1109/CCCM.2008.101
Regular:

Self-organizing feature map and some questions that challenge our attention in its application to cluster analysis on technological innovation ability of enterprises are expatiated on. Taking the... View More

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