IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on Digital Circuit Fault Location Procedure Based on LASAR

2008 ISECS International Colloquium on Computing, Communication, Control, and Management (CCCM)

Author(s): Su Wei ; Zhang Shide ; Xue Lijun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2008
Conference Location: Guangzhou, China
Conference Date: 3 August 2008
Volume: 2
Page(s): 322 - 326
ISBN (Paper): 978-0-7695-3290-5
DOI: 10.1109/CCCM.2008.253
Regular:

This paper describes LASAR V6 (logic automated stimulus response) that is the software for digital test program to generate fault dictionary used as a diagnosis database of fault isolation for a... View More

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