IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Digital Circuit Fault Diagnosis Interface Design and Realization Based on VXI

2008 ISECS International Colloquium on Computing, Communication, Control, and Management (CCCM)

Author(s): Liu Ying ; Su Wei ; Fan Tongshun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2008
Conference Location: Guangzhou, China
Conference Date: 3 August 2008
Volume: 2
Page(s): 215 - 219
ISBN (Paper): 978-0-7695-3290-5
DOI: 10.1109/CCCM.2008.256
Regular:

This paper discusses in detail the development process of general interface adapter in the digital circuit fault diagnosis system based on VXI. After introducing VXI bus, the paper gives overall... View More

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