IEEE - Institute of Electrical and Electronics Engineers, Inc. - Improved Kernel PCA Based on Wavelet for Fault Detection

2008 ISECS International Colloquium on Computing, Communication, Control, and Management (CCCM)

Author(s): Hongyan Wu ; Daoping Huang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2008
Conference Location: Guangzhou, China
Conference Date: 3 August 2008
Volume: 2
Page(s): 8 - 12
ISBN (Paper): 978-0-7695-3290-5
DOI: 10.1109/CCCM.2008.26
Regular:

KPCA is a promising method for solving nonlinear system in chemical process fault monitoring. In this paper, in order to improve the accuracy of KPCA for fault detection, a new method combined... View More

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