IEEE - Institute of Electrical and Electronics Engineers, Inc. - Un-Assessments Reflections by the Team, for the Team

Agile 2008

Author(s): W. Krebs ; P. Kroll ; E. Richard
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 August 2008
Conference Location: Toronto, ON, Canada
Conference Date: 4 August 2008
Page(s): 384 - 389
ISBN (Paper): 978-0-7695-3321-6
DOI: 10.1109/Agile.2008.36
Regular:

Metrics can backfire. They are useful for both self assessment by teams and retrospectives. But trying different metrics since 2002 with 80 teams at IBM has shown itpsilas not just a matter of... View More

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