IEEE - Institute of Electrical and Electronics Engineers, Inc. - recognition of wood defects based on artificial neural network

IEEE/ASME International Conference on Advanced Intelligent Mechatronics. AIM 2008

Author(s): Hongbo Mu ; Dawei Qi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Xian, China
Conference Date: 2 July 2008
Page(s): 1,232 - 1,237
ISBN (CD): 978-1-4244-2495-5
ISBN (Paper): 978-1-4244-2494-8
DOI: 10.1109/AIM.2008.4601838
Regular:

The recognition model of wood defects based on artificial neural network (ANN) was presented for classifying the defects effectively. X-ray was adopted as a measure method for log nondestructive... View More

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