IEEE - Institute of Electrical and Electronics Engineers, Inc. - Estimation of contour parameter uncertainties in permittivity imaging using MCMC sampling

2008 IEEE Sensor Array and Multichannel Signal Processing Workshop (SAM)

Author(s): C. Schwarzl ; D. Watzenig ; C. Fox
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Darmstadt, Germany
Conference Date: 21 July 2008
Page(s): 446 - 450
ISBN (CD): 978-1-4244-2241-8
ISBN (Paper): 978-1-4244-2240-1
DOI: 10.1109/SAM.2008.4606909
Regular:

Electrical capacitance tomography is targeted on estimating the spatial permittivity distribution of an inhomogeneous medium from measurements of trans-capacitance of a multi-electrode assembly... View More

Advertisement