IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mutation-Based Testing of Buffer Overflow Vulnerabilities

2008 IEEE 32nd International Computer Software and Applications Conference (COMPSAC)

Author(s): H. Shahriar ; M. Zulkernine
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Turku, Finland
Conference Date: 28 July 2008
Page(s): 979 - 984
ISBN (CD): 978-0-7695-3262-2
ISSN (Paper): 0730-3157
DOI: 10.1109/COMPSAC.2008.123
Regular:

Buffer overflow (BOF) is one of the major vulnerabilities that leads to non-secure software. Testing an implementation for BOF vulnerabilities is challenging as the underlying reasons of buffer... View More

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