IEEE - Institute of Electrical and Electronics Engineers, Inc. - Testing Optimization for Mission-Critical, Complex, Distributed Systems

2008 IEEE 32nd International Computer Software and Applications Conference (COMPSAC)

Author(s): M.G. Stochel ; R. Sztando
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Turku, Finland
Conference Date: 28 July 2008
Page(s): 847 - 852
ISBN (CD): 978-0-7695-3262-2
ISSN (Paper): 0730-3157
DOI: 10.1109/COMPSAC.2008.96
Regular:

The goal of the research was to optimize the regression testing of the software application to address the identified problem of a missing, unclear or even contradictory requirement. The approach... View More

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