IEEE - Institute of Electrical and Electronics Engineers, Inc. - Keynote: Hierarchical Fault Detection in Embedded Control Software

2008 IEEE 32nd International Computer Software and Applications Conference (COMPSAC)

Author(s): C. Zhou ; R. Kumar ; S. Jiang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Turku, Finland
Conference Date: 28 July 2008
Page(s): 816 - 823
ISBN (CD): 978-0-7695-3262-2
ISSN (Paper): 0730-3157
DOI: 10.1109/COMPSAC.2008.60
Regular:

We propose a two-tiered hierarchical approach for detecting faults in embedded control software during their runtime operation: The observed behavior is monitored against the appropriate... View More

Advertisement