IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Transformation-Based Approach to Generating Scenario-Oriented Test Cases from UML Activity Diagrams for Concurrent Applications

2008 IEEE 32nd International Computer Software and Applications Conference (COMPSAC)

Author(s): Chang-ai Sun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Turku, Finland
Conference Date: 28 July 2008
Page(s): 160 - 167
ISBN (CD): 978-0-7695-3262-2
ISSN (Paper): 0730-3157
DOI: 10.1109/COMPSAC.2008.74
Regular:

Testing concurrent applications is difficult yet important. UML activity diagrams are widely used to model concurrent interactions among multiple objects. We present a transformation-based... View More

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