IEEE - Institute of Electrical and Electronics Engineers, Inc. - Pattern and Policy Driven Log Analysis for Software Monitoring

2008 IEEE 32nd International Computer Software and Applications Conference (COMPSAC)

Author(s): A. Razavi ; K. Kontogiannis
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Turku, Finland
Conference Date: 28 July 2008
Page(s): 108 - 111
ISBN (CD): 978-0-7695-3262-2
ISSN (Paper): 0730-3157
DOI: 10.1109/COMPSAC.2008.81
Regular:

The component-based nature of large industrial software systems that consist of a number of diverse collaborating applications, pose significant challenges with respect to system maintenance,... View More

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