IEEE - Institute of Electrical and Electronics Engineers, Inc. - The impact of top management team conflict on new product development: The case of Taiwan and the United States

PICMET '08 - 2008 Portland International Conference on Management of Engineering & Technology

Author(s): Tsun-Jui Hsieh ; Hsien-Jui Chung
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Cape Town, South Africa
Conference Date: 27 July 2008
Page(s): 1,206 - 1,213
ISBN (CD): 978-1-890843-18-2
ISBN (Paper): 978-1-890843-17-5
DOI: 10.1109/PICMET.2008.4599730
Regular:

This study demonstrates how top management team (TMT) conflict impacts new product development (NPD) under cultural differences between Taiwan and the United States. Based on cultural differences,... View More

Advertisement