IEEE - Institute of Electrical and Electronics Engineers, Inc. - Applying neural network to explore the influences of the patent indicators upon the market value of the American pharmaceutical companies

PICMET '08 - 2008 Portland International Conference on Management of Engineering & Technology

Author(s): Yu-Shan Chen ; Ke-Chiun Chang ; I-Chun Shih
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Cape Town, South Africa
Conference Date: 27 July 2008
Page(s): 80 - 88
ISBN (CD): 978-1-890843-18-2
ISBN (Paper): 978-1-890843-17-5
DOI: 10.1109/PICMET.2008.4599612
Regular:

This study applies the artificial neural network technique to explore the influence of the patent performance upon the market value of the pharmaceutical companies in US. The result shows that... View More

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