IEEE - Institute of Electrical and Electronics Engineers, Inc. - High resolution three-dimensional reconstruction of photonic crystal structure found in beetle scales

2008 Digest of the IEEE/LEOS Summer Topical Meetings Conference

Author(s): J.W. Galusha ; L.R. Richey ; M.H. Bartl
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Acapulco, Mexico
Conference Date: 21 July 2008
Page(s): 83 - 84
ISBN (CD): 978-1-4244-1926-5
ISBN (Paper): 978-1-4244-1925-8
ISSN (Paper): 1099-4742
DOI: 10.1109/LEOSST.2008.4590500
Regular:

In this paper we demonstrate how sequential FIB milling combined with scanning electron microscopy imaging can be used to achieve a previously unprecedented high-resolution 3D reconstruction of... View More

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