IEEE - Institute of Electrical and Electronics Engineers, Inc. - Recent paraxial diode experiments on RITS-6

2008 IEEE 35th International Conference on Plasma Science

Author(s): K. Hahn ; B.V. Oliver ; S. Cordova ; M.D. Johnston ; J. Leckbee ; I. Molina ; S. Portillo ; D.J. Bittlestone ; G. Cooper ; J. McLean ; N. Bruner ; D.V. Rose ; D.R. Welch ; E. Schamiloglu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Karlsruhe, Germany
Conference Date: 15 June 2008
Page(s): 1
ISBN (CD): 978-1-4244-1930-2
ISBN (Paper): 978-1-4244-1929-6
ISSN (Paper): 0730-9244
DOI: 10.1109/PLASMA.2008.4590851
Regular:

Summary form only given. Development of intense electron beam-driven diodes for flash X-ray radiography is being carried out at 7.5-12 MV on the RITS-6 accelerator at Sandia National Laboratories.... View More

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