IEEE - Institute of Electrical and Electronics Engineers, Inc. - Risk management education support system in company

2008 IEEE International Conference on Information Reuse and Integration (2008 IRI)

Author(s): Satoshi Takahashi ; Muhammad Dzulqarnain ; Takayuki Fujimoto ; Tokuro Matsuo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Las Vegas, NV, USA, USA
Conference Date: 13 July 2008
Page(s): 137 - 142
ISBN (CD): 978-1-4244-2660-7
ISBN (Paper): 978-1-4244-2659-1
DOI: 10.1109/IRI.2008.4583019
Regular:

In resent years, many companies engender fraudulences and affairs, and affront several crises. Such situations are defined as risks and are classified with some parts and hierarchies. Low-leveled... View More

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