IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scenario-Based Assessment for Database Course

IEEE International Conference on Advanced Learning Technologies (ICALT 2008)

Author(s): R. Iqbal ; A. James
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 July 2008
Conference Location: Santander, Cantabria, Spain
Conference Date: 1 July 2008
Page(s): 735 - 736
ISBN (Paper): 978-0-7695-3167-0
DOI: 10.1109/ICALT.2008.256
Regular:

This paper presents some reflection upon the use of a flexible scenario-based method for the assessment of a third level module in databases in a UK university. The method is designed to encourage... View More

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