IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement of mid-infrared alinsb light-emitting diodes with surface patterning

2008 Conference on Lasers and Electro-Optics (CLEO)

Author(s): I.J. Buss ; B.I. Mirza ; G.R. Nash ; C. Storey ; L. Buckle ; S.D. Coomber ; M.T. Emeny ; J.G. Rarity ; M.J. Cryan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: San Jose, CA, USA
Conference Date: 4 May 2008
Page(s): 1 - 2
ISBN (Paper): 978-1-55752-859-9
DOI: 10.1109/CLEO.2008.4552099
Regular:

3D FDTD modelling is employed to design a surface pattern for mid-IR LEDs. Measured enhancement factors over an un-patterned device of 8% and 14% are found at 300 K and 25 K respectively.

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