IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measurement of a flat lens focusing in a 2D photonic crystal at optical wavelength

2008 Conference on Lasers and Electro-Optics (CLEO)

Author(s): N. Fabre ; L. Lalouat ; B. Cluzel ; X. Melique ; D. Lippens ; F. de Fornel ; O. Vanbesien
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: San Jose, CA, USA
Conference Date: 4 May 2008
Page(s): 1 - 2
ISBN (Paper): 978-1-55752-859-9
DOI: 10.1109/CLEO.2008.4551615
Regular:

Using scanning near field optical microscopy (SNOM), we observed the focusing effect provided by negative refraction in a 2D photonic crystal. Experimental observations are analyzed in light of... View More

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