IEEE - Institute of Electrical and Electronics Engineers, Inc. - Correcting for nonideal probe locations in near-field scanning measurements of antenna parameters

2008 Conference on Precision Electromagnetic Measurements

Author(s): R.C. Wittmann ; M.H. Francis ; B.K. Alpert
Sponsor(s): Bur. Int. Poids Meas. (BIPM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Broomfield, CO, USA
Conference Date: 8 June 2008
Page(s): 636 - 637
ISBN (CD): 978-1-4244-2400-9
ISBN (Paper): 978-1-4244-2399-6
DOI: 10.1109/CPEM.2008.4574940
Regular:

We discuss efficient near-field to far-field transformation algorithms that relax the usual restriction that data points be located on regular grids on special surfaces (planar, spherical, or... View More

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