IEEE - Institute of Electrical and Electronics Engineers, Inc. - Compact extended port capable of full 2-port calibrations using optical techniques

2008 Conference on Precision Electromagnetic Measurements

Author(s): M. Hirose ; S. Kurokawa
Sponsor(s): Bur. Int. Poids Meas. (BIPM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Broomfield, CO, USA
Conference Date: 8 June 2008
Page(s): 508 - 509
ISBN (CD): 978-1-4244-2400-9
ISBN (Paper): 978-1-4244-2399-6
DOI: 10.1109/CPEM.2008.4574876
Regular:

We have developed a compact extended port using optical techniques that can be used with full 2-port calibrations such as SOLT, SOLR, TRL, and et al. This extended port is an advanced and compact... View More

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