IEEE - Institute of Electrical and Electronics Engineers, Inc. - Uncertainty analysis for noise-parameter measurements
2008 Conference on Precision Electromagnetic Measurements
Author(s): | J. Randa |
Sponsor(s): | Bur. Int. Poids Meas. (BIPM) |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 June 2008 |
Conference Location: | Broomfield, CO, USA |
Conference Date: | 8 June 2008 |
Page(s): | 498 - 499 |
ISBN (CD): | 978-1-4244-2400-9 |
ISBN (Paper): | 978-1-4244-2399-6 |
DOI: | 10.1109/CPEM.2008.4574871 |
Regular:
A brief summary is presented for the uncertainty analysis for measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat... View More