IEEE - Institute of Electrical and Electronics Engineers, Inc. - RF measurements of nanoscale devices: Challenges and opportunities

2008 Conference on Precision Electromagnetic Measurements

Author(s): P.J. Burke ; C. Rutherglen
Sponsor(s): Bur. Int. Poids Meas. (BIPM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Broomfield, CO, USA
Conference Date: 8 June 2008
Page(s): 494 - 495
ISBN (CD): 978-1-4244-2400-9
ISBN (Paper): 978-1-4244-2399-6
DOI: 10.1109/CPEM.2008.4574869
Regular:

This invited talk will describe some of the opportunities and challenges associated with RF measurements of nanoelectronic devices.

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