IEEE - Institute of Electrical and Electronics Engineers, Inc. - Metrological characterizations of wideband digitizers

2008 Conference on Precision Electromagnetic Measurements

Author(s): P. Espel ; A. Bounouh ; A. Poletaeff
Sponsor(s): Bur. Int. Poids Meas. (BIPM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Broomfield, CO, USA
Conference Date: 8 June 2008
Page(s): 390 - 391
ISBN (CD): 978-1-4244-2400-9
ISBN (Paper): 978-1-4244-2399-6
DOI: 10.1109/CPEM.2008.4574817
Regular:

This paper deals with the characterization of the metrological performance of digitizers so that they can be used for metrology applications. Apart from dc behaviour such as linearity, stability,... View More

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