IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new short-bar method for 4TP admittance standards calibration by using modified Z-matrix expression to improve S/N for higher impedance

2008 Conference on Precision Electromagnetic Measurements

Author(s): K. Suzuki
Sponsor(s): Bur. Int. Poids Meas. (BIPM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Broomfield, CO, USA
Conference Date: 8 June 2008
Page(s): 350 - 351
ISBN (CD): 978-1-4244-2400-9
ISBN (Paper): 978-1-4244-2399-6
DOI: 10.1109/CPEM.2008.4574797
Regular:

This paper describes how to calibrate four-terminal-pair (4TP) admittance standards using a new short-bar method with modified Z-matrix expression containing a correction term. The short-bar... View More

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