IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measuring flicker with discrete fourier transform

2008 Conference on Precision Electromagnetic Measurements

Author(s): P. Espel ; A. Poletaeff
Sponsor(s): Bur. Int. Poids Meas. (BIPM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Broomfield, CO, USA
Conference Date: 8 June 2008
Page(s): 222 - 223
ISBN (CD): 978-1-4244-2400-9
ISBN (Paper): 978-1-4244-2399-6
DOI: 10.1109/CPEM.2008.4574733
Regular:

This paper describes a new standard for precision measurements of flicker. Two different methods are used and compared. The absolute standard uncertainty (1sigma) is estimated to be a few parts in... View More

Advertisement