IEEE - Institute of Electrical and Electronics Engineers, Inc. - Stabilization study of resistive thin films for ac resistors application

2008 Conference on Precision Electromagnetic Measurements

Author(s): A. Morilhat ; A. Bounouh ; F. Lapostolle ; A. Billard ; F. Ziade ; D. Leprat
Sponsor(s): Bur. Int. Poids Meas. (BIPM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Broomfield, CO, USA
Conference Date: 8 June 2008
Page(s): 114 - 115
ISBN (CD): 978-1-4244-2400-9
ISBN (Paper): 978-1-4244-2399-6
DOI: 10.1109/CPEM.2008.4574679
Regular:

This paper presents results on the development of metallic ultra thin films on cylindrical alumina substrate, which are the basis of coaxial ac resistors. Ni80Cr20 and... View More

Advertisement