IEEE - Institute of Electrical and Electronics Engineers, Inc. - Frequency stability characterisation of a strontium trapped ion optical frequency standard

2008 Conference on Precision Electromagnetic Measurements

Author(s): G.P. Barwood ; P. Gill ; G. Huang ; H.A. Klein
Sponsor(s): Bur. Int. Poids Meas. (BIPM)
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Broomfield, CO, USA
Conference Date: 8 June 2008
Page(s): 62 - 63
ISBN (CD): 978-1-4244-2400-9
ISBN (Paper): 978-1-4244-2399-6
DOI: 10.1109/CPEM.2008.4574653
Regular:

Two 674-nm optical frequency standards based on the 2S1/2 - 2D5/2 transition in 88Sr+ are under development at NPL. Comparison of... View More

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