IEEE - Institute of Electrical and Electronics Engineers, Inc. - New condition monitoring techniques for reliably drive systems operation

2008 International Conference on Condition Monitoring and Diagnosis, CMD 2008

Author(s): A.S. Hennache
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Beijing, China
Conference Date: 21 April 2008
Page(s): 764 - 768
ISBN (CD): 978-1-4244-1622-6
ISBN (Paper): 978-1-4244-1621-9
DOI: 10.1109/CMD.2008.4580397
Regular:

The dominant application of electronics today is to process information. The computer industry is the biggest user of semiconductor devices and consumer electronics. Due to the successful... View More

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