IEEE - Institute of Electrical and Electronics Engineers, Inc. - Condition monitoring and plenary diagnostics strategy based on event driven threads

2008 International Conference on Condition Monitoring and Diagnosis, CMD 2008

Author(s): Wenjun Xi ; Yuguang Feng ; Yu Zhou ; Bo Xu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Beijing, China
Conference Date: 21 April 2008
Page(s): 576 - 578
ISBN (CD): 978-1-4244-1622-6
ISBN (Paper): 978-1-4244-1621-9
DOI: 10.1109/CMD.2008.4580353
Regular:

Condition monitoring and fault diagnosis is the groundwork of condition-based maintenance, and much research has been done about diagnostic algorithm and monitoring manufactures, but less research... View More

Advertisement